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In situ observations of Berkovich indentation induced phase transitions in crystalline silicon films
The pressure induced phase transitions of crystalline Si films were studied in situ under a Berkovich probe using a Raman spectroscopy-enhanced instrumented indentation technique. The observations suggested strain and time as important parameters in the nucleation and growth of high-pressure phases...
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| Publicado en: | Scr Mater |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
2016
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4908827/ https://ncbi.nlm.nih.gov/pubmed/27325910 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.scriptamat.2016.04.007 |
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