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Polarized Raman scattering study of kesterite type Cu(2)ZnSnS(4) single crystals
A non-destructive Raman spectroscopy has been widely used as a complimentary method to X-ray diffraction characterization of Cu(2)ZnSnS(4) (CZTS) thin films, yet our knowledge of the Raman active fundamental modes in this material is far from complete. Focusing on polarized Raman spectroscopy provid...
Gorde:
| Argitaratua izan da: | Sci Rep |
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| Egile Nagusiak: | , , , , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Nature Publishing Group
2016
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4726006/ https://ncbi.nlm.nih.gov/pubmed/26776727 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep19414 |
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