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Polarized Raman scattering study of kesterite type Cu(2)ZnSnS(4) single crystals
A non-destructive Raman spectroscopy has been widely used as a complimentary method to X-ray diffraction characterization of Cu(2)ZnSnS(4) (CZTS) thin films, yet our knowledge of the Raman active fundamental modes in this material is far from complete. Focusing on polarized Raman spectroscopy provid...
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| Publicat a: | Sci Rep |
|---|---|
| Autors principals: | , , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Nature Publishing Group
2016
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4726006/ https://ncbi.nlm.nih.gov/pubmed/26776727 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep19414 |
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