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Development of a novel nanoindentation technique by utilizing a dual-probe AFM system
A novel instrumentation approach to nanoindentation is described that exhibits improved resolution and depth sensing. The approach is based on a multi-probe scanning probe microscopy (SPM) tool that utilizes tuning-fork based probes for both indentation and depth sensing. Unlike nanoindentation expe...
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| Publicat a: | Beilstein J Nanotechnol |
|---|---|
| Autors principals: | , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Beilstein-Institut
2015
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4660937/ https://ncbi.nlm.nih.gov/pubmed/26665072 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.205 |
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