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Coherent interaction with two-level fluctuators using near field scanning microwave microscopy
Near field Scanning Microwave Microscopy (NSMM) is a scanning probe technique that non-invasively can obtain material properties on the nano-scale at microwave frequencies. While focus has been on developing room-temperature systems it was recently shown that this technique can potentially reach the...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2015
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4657005/ https://ncbi.nlm.nih.gov/pubmed/26597218 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep17176 |
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