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Electron Beam Induced Artifacts During in situ TEM Deformation of Nanostructured Metals
A critical assumption underlying in situ transmission electron microscopy studies is that the electron beam (e-beam) exposure does not fundamentally alter the intrinsic deformation behavior of the materials being probed. Here, we show that e-beam exposure causes increased dislocation activation and...
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| 出版年: | Sci Rep |
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| 主要な著者: | , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group
2015
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4639785/ https://ncbi.nlm.nih.gov/pubmed/26552934 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep16345 |
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