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Imaging properties of extended depth of field microscopy through single-shot focus scanning
Although the single-shot focus scanning technique (SSFS) has been experimentally demonstrated for extended depth of field (EDOF) imaging, few work has been performed to characterize its imaging properties and limitations. In this paper, based on an analytical model of a SSFS system, we examined the...
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| Publicado no: | Opt Express |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Optical Society of America
2015
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4523374/ https://ncbi.nlm.nih.gov/pubmed/25969109 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/OE.23.010714 |
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