Surface Termination Conversion during SrTiO(3) Thin Film Growth Revealed by X-ray Photoelectron Spectroscopy

Emerging electrical and magnetic properties of oxide interfaces are often dominated by the termination and stoichiometry of substrates and thin films, which depend critically on the growth conditions. Currently, these quantities have to be measured separately with different sophisticated techniques....

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Bibliographic Details
Published in:Sci Rep
Main Authors: Baeumer, Christoph, Xu, Chencheng, Gunkel, Felix, Raab, Nicolas, Heinen, Ronja Anika, Koehl, Annemarie, Dittmann, Regina
Format: Artigo
Language:Inglês
Published: Nature Publishing Group 2015
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Article
Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC4507138/
https://ncbi.nlm.nih.gov/pubmed/26189436
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep11829
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