Single-image phase retrieval using an edge illumination X-ray phase-contrast imaging setup

A method is proposed which enables the retrieval of the thickness or of the projected electron density of a sample from a single input image acquired with an edge illumination phase-contrast imaging setup. The method assumes the case of a quasi-homogeneous sample, i.e. a sample with a constant ratio...

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Detalles Bibliográficos
Publicado en:J Synchrotron Radiat
Main Authors: Diemoz, Paul C., Vittoria, Fabio A., Hagen, Charlotte K., Endrizzi, Marco, Coan, Paola, Brun, Emmanuel, Wagner, Ulrich H., Rau, Christoph, Robinson, Ian K., Bravin, Alberto, Olivo, Alessandro
Formato: Artigo
Idioma:Inglês
Publicado: International Union of Crystallography 2015
Assuntos:
Research Papers
Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC4489537/
https://ncbi.nlm.nih.gov/pubmed/26134813
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577515008978
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