Recent advances in edge illumination x-ray phase-contrast tomography

Edge illumination (EI) is an x-ray phase-contrast imaging technique, exploiting sensitivity to x-ray refraction to visualize features, which are often not detected by conventional absorption-based radiography. The method does not require a high degree of spatial coherence and is achromatic and, ther...

Полное описание

Сохранить в:
Библиографические подробности
Опубликовано в: :J Med Imaging (Bellingham)
Главные авторы: Zamir, Anna, Hagen, Charlotte, Diemoz, Paul C., Endrizzi, Marco, Vittoria, Fabio, Chen, Yujia, Anastasio, Mark A., Olivo, Alessandro
Формат: Artigo
Язык:Inglês
Опубликовано: Society of Photo-Optical Instrumentation Engineers 2017
Предметы:
Review Papers
Online-ссылка:https://ncbi.nlm.nih.gov/pmc/articles/PMC5641577/
https://ncbi.nlm.nih.gov/pubmed/29057286
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/1.JMI.4.4.040901
Метки: Добавить метку
Нет меток, Требуется 1-ая метка записи!

Схожие документы