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Recent advances in edge illumination x-ray phase-contrast tomography
Edge illumination (EI) is an x-ray phase-contrast imaging technique, exploiting sensitivity to x-ray refraction to visualize features, which are often not detected by conventional absorption-based radiography. The method does not require a high degree of spatial coherence and is achromatic and, ther...
Gardado en:
| Publicado en: | J Med Imaging (Bellingham) |
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| Main Authors: | , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Society of Photo-Optical Instrumentation Engineers
2017
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5641577/ https://ncbi.nlm.nih.gov/pubmed/29057286 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/1.JMI.4.4.040901 |
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