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Design and performance of the APPLE-Knot undulator

Along with the development of accelerator technology, synchrotron emittance has continuously decreased. This results in increased brightness, but also causes a heavy heat load on beamline optics. Recently, optical surfaces with 0.1 nm micro-roughness and 0.05 µrad slope error (r.m.s.) have become co...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:J Synchrotron Radiat
Egile Nagusiak: Ji, Fuhao, Chang, Rui, Zhou, Qiaogen, Zhang, Wei, Ye, Mao, Sasaki, Shigemi, Qiao, Shan
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: International Union of Crystallography 2015
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC4489533/
https://ncbi.nlm.nih.gov/pubmed/26134793
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577515006062
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