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Ab initio simulation of diffractometer instrumental function for high-resolution X-ray diffraction
Modeling of the X-ray diffractometer instrumental function for a given optics configuration is important both for planning experiments and for the analysis of measured data. A fast and universal method for instrumental function simulation, suitable for fully automated computer realization and descri...
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| Publicat a: | J Appl Crystallogr |
|---|---|
| Autors principals: | , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2015
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4453973/ https://ncbi.nlm.nih.gov/pubmed/26089760 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576715006986 |
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