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Characterization of nanostructured ZnO thin films deposited through vacuum evaporation
This work presents a novel technique to deposit ZnO thin films through a metal vacuum evaporation technique using colloidal nanoparticles (average size of 30 nm), which were synthesized by our research group, as source. These thin films had a thickness between 45 and 123 nm as measured by profilomet...
Tallennettuna:
| Julkaisussa: | Beilstein J Nanotechnol |
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| Päätekijät: | , , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Beilstein-Institut
2015
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4419655/ https://ncbi.nlm.nih.gov/pubmed/25977868 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.100 |
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