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Characterization of nanostructured ZnO thin films deposited through vacuum evaporation

This work presents a novel technique to deposit ZnO thin films through a metal vacuum evaporation technique using colloidal nanoparticles (average size of 30 nm), which were synthesized by our research group, as source. These thin films had a thickness between 45 and 123 nm as measured by profilomet...

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Detalhes bibliográficos
Publicado no:Beilstein J Nanotechnol
Main Authors: Alvarado, Jose Alberto, Maldonado, Arturo, Juarez, Héctor, Pacio, Mauricio, Perez, Rene
Formato: Artigo
Idioma:Inglês
Publicado em: Beilstein-Institut 2015
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4419655/
https://ncbi.nlm.nih.gov/pubmed/25977868
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.100
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