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Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects due to its high spatial resolution imaging capabilities and chemical specificity. In this work we focus on the application of ToF-SIMS to gain insight int...
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| Publicat a: | Surf Interface Anal |
|---|---|
| Autors principals: | , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
2014
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4408321/ https://ncbi.nlm.nih.gov/pubmed/25918450 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/sia.5623 |
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