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Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects due to its high spatial resolution imaging capabilities and chemical specificity. In this work we focus on the application of ToF-SIMS to gain insight int...

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Bibliografiske detaljer
Udgivet i:Surf Interface Anal
Main Authors: Lovrić, Jelena, Keighron, Jacqueline D., Angerer, Tina B., Li, Xianchan, Malmberg, Per, Fletcher, John S., Ewing, Andrew G.
Format: Artigo
Sprog:Inglês
Udgivet: 2014
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4408321/
https://ncbi.nlm.nih.gov/pubmed/25918450
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/sia.5623
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