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Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects due to its high spatial resolution imaging capabilities and chemical specificity. In this work we focus on the application of ToF-SIMS to gain insight int...

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Detalles Bibliográficos
Publicado en:Surf Interface Anal
Main Authors: Lovrić, Jelena, Keighron, Jacqueline D., Angerer, Tina B., Li, Xianchan, Malmberg, Per, Fletcher, John S., Ewing, Andrew G.
Formato: Artigo
Idioma:Inglês
Publicado: 2014
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Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC4408321/
https://ncbi.nlm.nih.gov/pubmed/25918450
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/sia.5623
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