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Positronics of subnanometer atomistic imperfections in solids as a high-informative structure characterization tool
Methodological possibilities of positron annihilation lifetime (PAL) spectroscopy applied to characterize different types of nanomaterials treated within three-term fitting procedure are critically reconsidered. In contrast to conventional three-term analysis based on admixed positron- and positroni...
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| 出版年: | Nanoscale Res Lett |
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| 主要な著者: | , , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Springer US
2015
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| 主題: | |
| オンライン・アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4385039/ https://ncbi.nlm.nih.gov/pubmed/25852373 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-015-0764-z |
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