Shpotyuk, O., Filipecki, J., Ingram, A., Golovchak, R., Vakiv, M., Klym, H., . . . Kozdras, A. (2015). Positronics of subnanometer atomistic imperfections in solids as a high-informative structure characterization tool. Nanoscale Res Lett.
Citación estilo ChicagoShpotyuk, Oleh, Jacek Filipecki, Adam Ingram, Roman Golovchak, Mykola Vakiv, Halyna Klym, Valentyna Balitska, Mykhaylo Shpotyuk, and Andrzej Kozdras. "Positronics of Subnanometer Atomistic Imperfections in Solids As a High-informative Structure Characterization Tool." Nanoscale Res Lett 2015.
Cita MLAShpotyuk, Oleh, et al. "Positronics of Subnanometer Atomistic Imperfections in Solids As a High-informative Structure Characterization Tool." Nanoscale Res Lett 2015.
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