APA引文

Shpotyuk, O., Filipecki, J., Ingram, A., Golovchak, R., Vakiv, M., Klym, H., . . . Kozdras, A. (2015). Positronics of subnanometer atomistic imperfections in solids as a high-informative structure characterization tool. Nanoscale Res Lett.

Citação norma Chicago

Shpotyuk, Oleh, Jacek Filipecki, Adam Ingram, Roman Golovchak, Mykola Vakiv, Halyna Klym, Valentyna Balitska, Mykhaylo Shpotyuk, and Andrzej Kozdras. "Positronics of Subnanometer Atomistic Imperfections in Solids As a High-informative Structure Characterization Tool." Nanoscale Res Lett 2015.

MLA引文

Shpotyuk, Oleh, et al. "Positronics of Subnanometer Atomistic Imperfections in Solids As a High-informative Structure Characterization Tool." Nanoscale Res Lett 2015.