Shpotyuk, O., Filipecki, J., Ingram, A., Golovchak, R., Vakiv, M., Klym, H., . . . Kozdras, A. (2015). Positronics of subnanometer atomistic imperfections in solids as a high-informative structure characterization tool. Nanoscale Res Lett.
Styl ChicagoShpotyuk, Oleh, Jacek Filipecki, Adam Ingram, Roman Golovchak, Mykola Vakiv, Halyna Klym, Valentyna Balitska, Mykhaylo Shpotyuk, a Andrzej Kozdras. "Positronics of Subnanometer Atomistic Imperfections in Solids As a High-informative Structure Characterization Tool." Nanoscale Res Lett 2015.
Citace podle MLAShpotyuk, Oleh, et al. "Positronics of Subnanometer Atomistic Imperfections in Solids As a High-informative Structure Characterization Tool." Nanoscale Res Lett 2015.
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