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Thickness Dispersion of Surface Plasmon of Ag Nano-thin Films: Determination by Ellipsometry Iterated with Transmittance Method

Effective optical constants of Ag thin films are precisely determined with effective thickness simultaneously by using an ellipsometry iterated with transmittance method. Unlike the bulk optical constants in Palik's database the effective optical constants of ultrathin Ag films are found to str...

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Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Gong, Junbo, Dai, Rucheng, Wang, Zhongping, Zhang, Zengming
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group 2015
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4369689/
https://ncbi.nlm.nih.gov/pubmed/25797217
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep09279
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