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Fundamental edge broadening effects during focused electron beam induced nanosynthesis
The present study explores lateral broadening effects of 3D structures fabricated through focused electron beam induced deposition using MeCpPt(IV)Me(3) precursor. In particular, the scaling behavior of proximity effects as a function of the primary electron energy and the deposit height is investig...
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| Yayımlandı: | Beilstein J Nanotechnol |
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| Asıl Yazarlar: | , , , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Beilstein-Institut
2015
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| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4362041/ https://ncbi.nlm.nih.gov/pubmed/25821687 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.47 |
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