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Fundamental edge broadening effects during focused electron beam induced nanosynthesis
The present study explores lateral broadening effects of 3D structures fabricated through focused electron beam induced deposition using MeCpPt(IV)Me(3) precursor. In particular, the scaling behavior of proximity effects as a function of the primary electron energy and the deposit height is investig...
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| Publicado no: | Beilstein J Nanotechnol |
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| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2015
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4362041/ https://ncbi.nlm.nih.gov/pubmed/25821687 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.47 |
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