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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Atomic force microscopy (AFM) uses a pyramidal tip attached to a cantilever to probe the force response of a surface. The deflections of the tip can be measured to ~10 pN by a laser and sectored detector, which can be converted to image topography. Amplitude modulation or “tapping mode” AFM involves...

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Bibliografische gegevens
Gepubliceerd in:J Vis Exp
Hoofdauteurs: Kroeger, Marie E., Sorenson, Blaire A., Thomas, J. Santoro, Stojković, Emina A., Tsonchev, Stefan, Nicholson, Kenneth T.
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: MyJove Corporation 2014
Onderwerpen:
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4353382/
https://ncbi.nlm.nih.gov/pubmed/25407118
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3791/52164
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