Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Atomic force microscopy (AFM) uses a pyramidal tip attached to a cantilever to probe the force response of a surface. The deflections of the tip can be measured to ~10 pN by a laser and sectored detector, which can be converted to image topography. Amplitude modulation or “tapping mode” AFM involves...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:J Vis Exp
Egile Nagusiak: Kroeger, Marie E., Sorenson, Blaire A., Thomas, J. Santoro, Stojković, Emina A., Tsonchev, Stefan, Nicholson, Kenneth T.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: MyJove Corporation 2014
Gaiak:
Physics
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC4353382/
https://ncbi.nlm.nih.gov/pubmed/25407118
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3791/52164
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