טוען...
Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution
We present precise measurements of atomic distributions of low electron density contrast at a buried interface using soft x-ray resonant scattering. This approach allows one to construct chemically and spatially highly resolved atomic distribution profile upto several tens of nanometer in a non-dest...
שמור ב:
| הוצא לאור ב: | Sci Rep |
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| Main Authors: | , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Nature Publishing Group
2015
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4345341/ https://ncbi.nlm.nih.gov/pubmed/25726866 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep08618 |
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