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Defects in Silicene: Vacancy Clusters, Extended Line Defects, and Di-adatoms

Defects are almost inevitable during the fabrication process, and their existence strongly affects thermodynamic and (opto)electronic properties of two-dimensional materials. Very recent experiments have provided clear evidence for the presence of larger multi-vacancies in silicene, but their struct...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Julkaisussa:Sci Rep
Päätekijät: Li, Shuang, Wu, Yifeng, Tu, Yi, Wang, Yonghui, Jiang, Tong, Liu, Wei, Zhao, Yonghao
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Nature Publishing Group 2015
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC4306108/
https://ncbi.nlm.nih.gov/pubmed/25619941
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep07881
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