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Investigation on Blind Tip Reconstruction Errors Caused by Sample Features
Precision measurements of a nanoscale sample surface using an atomic force microscope (AFM) require a precise quantitative knowledge of the 3D tip shape. Blind tip reconstruction (BTR), established by Villarrubia, gives an outer bound with larger errors if the tip characterizer is not appropriate. I...
Tallennettuna:
| Julkaisussa: | Sensors (Basel) |
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| Päätekijät: | , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
MDPI
2014
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4299057/ https://ncbi.nlm.nih.gov/pubmed/25490584 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s141223159 |
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