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Investigation on Blind Tip Reconstruction Errors Caused by Sample Features
Precision measurements of a nanoscale sample surface using an atomic force microscope (AFM) require a precise quantitative knowledge of the 3D tip shape. Blind tip reconstruction (BTR), established by Villarrubia, gives an outer bound with larger errors if the tip characterizer is not appropriate. I...
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| Publicado no: | Sensors (Basel) |
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| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2014
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4299057/ https://ncbi.nlm.nih.gov/pubmed/25490584 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s141223159 |
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