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Coherent X-Ray Diffraction Imaging and Characterization of Strain in Silicon-on-Insulator Nanostructures
Coherent X-ray diffraction imaging (CDI) has emerged in the last decade as a promising high resolution lens-less imaging approach for the characterization of various samples. It has made significant technical progress through developments in source, algorithm and imaging methodologies thus enabling...
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| Udgivet i: | Adv Mater |
|---|---|
| Main Authors: | , , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
BlackWell Publishing Ltd
2014
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4282757/ https://ncbi.nlm.nih.gov/pubmed/24955950 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/adma.201304511 |
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