Mapping the continuous reciprocal space intensity distribution of X-ray serial crystallography

Serial crystallography using X-ray free-electron lasers enables the collection of tens of thousands of measurements from an equal number of individual crystals, each of which can be smaller than 1 µm in size. This manuscript describes an alternative way of handling diffraction data recorded by seria...

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Autors principals: Yefanov, Oleksandr, Gati, Cornelius, Bourenkov, Gleb, Kirian, Richard A., White, Thomas A., Spence, John C. H., Chapman, Henry N., Barty, Anton
Format: Artigo
Idioma:Inglês
Publicat: The Royal Society 2014
Matèries:
Part II: Technique development
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC4052869/
https://ncbi.nlm.nih.gov/pubmed/24914160
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1098/rstb.2013.0333
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