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The correlation of single-particle diffraction patterns as a continuous function of particle orientation
A statistical model for X-ray scattering of a non-periodic sample to high angles is introduced. It is used to calculate analytically the correlation of distinct diffraction measurements of a particle as a continuous function of particle orientation. Diffraction measurements with shot-noise are also...
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| Autor principal: | |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
The Royal Society
2014
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| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4052865/ https://ncbi.nlm.nih.gov/pubmed/24914156 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1098/rstb.2013.0329 |
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