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Polymer ferroelectric field-effect memory device with SnO channel layer exhibits record hole mobility

Here we report for the first time a hybrid p-channel polymer ferroelectric field-effect transistor memory device with record mobility. The memory device, fabricated at 200°C on both plastic polyimide and glass substrates, uses ferroelectric polymer P(VDF-TrFE) as the gate dielectric and transparent...

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Detalles Bibliográficos
Main Authors: Caraveo-Frescas, J. A., Khan, M. A., Alshareef, H. N.
Formato: Artigo
Idioma:Inglês
Publicado: Nature Publishing Group 2014
Assuntos:
Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC4050383/
https://ncbi.nlm.nih.gov/pubmed/24912617
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep05243
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