Synchronous digitization for high dynamic range lock-in amplification in beam-scanning microscopy

Digital lock-in amplification (LIA) with synchronous digitization (SD) is shown to provide significant signal to noise (S/N) and linear dynamic range advantages in beam-scanning microscopy measurements using pulsed laser sources. Direct comparisons between SD-LIA and conventional LIA in homodyne sec...

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Hlavní autoři: Muir, Ryan D., Sullivan, Shane Z., Oglesbee, Robert A., Simpson, Garth J.
Médium: Artigo
Jazyk:Inglês
Vydáno: Author(s). 2014
Témata:
Microscopy and Imaging
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC3987178/
https://ncbi.nlm.nih.gov/pubmed/24689588
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4865116
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