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Synchronous digitization for high dynamic range lock-in amplification in beam-scanning microscopy
Digital lock-in amplification (LIA) with synchronous digitization (SD) is shown to provide significant signal to noise (S/N) and linear dynamic range advantages in beam-scanning microscopy measurements using pulsed laser sources. Direct comparisons between SD-LIA and conventional LIA in homodyne sec...
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| Hoofdauteurs: | , , , |
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| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
Author(s).
2014
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3987178/ https://ncbi.nlm.nih.gov/pubmed/24689588 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4865116 |
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