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Optimization of the X-ray incidence angle in photoelectron spectrometers

The interplay between the angle-dependent X-ray reflectivity, X-ray absorption and the photoelectron attenuation length in the photoelectron emission process determines the optimal X-ray incidence angle that maximizes the photoelectron signal. Calculations in the wide VUV to the hard X-ray energy ra...

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Detalhes bibliográficos
Autor principal: Strocov, Vladimir N.
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2013
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3943557/
https://ncbi.nlm.nih.gov/pubmed/23765292
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049513007747
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