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Depth profiling of polymer films with grazing-incidence small-angle X-ray scattering

A model-free method of reconstructing depth-specific lateral scattering from incident-angle-resolved grazing-incidence small-angle X-ray scattering (GISAXS) data is proposed. The information on the material which is available through variation of the X-ray penetration depth with incident angle is ac...

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Detalhes bibliográficos
Main Authors: Singh, Marsha A., Groves, Michael N.
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2009
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC2724987/
https://ncbi.nlm.nih.gov/pubmed/19349663
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0108767309007508
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