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Dimension Reduction of Multivariable Optical Emission Spectrometer Datasets for Industrial Plasma Processes

A new data dimension-reduction method, called Internal Information Redundancy Reduction (IIRR), is proposed for application to Optical Emission Spectroscopy (OES) datasets obtained from industrial plasma processes. For example in a semiconductor manufacturing environment, real-time spectral emission...

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Detalhes bibliográficos
Main Authors: Yang, Jie, McArdle, Conor, Daniels, Stephen
Formato: Artigo
Idioma:Inglês
Publicado em: Molecular Diversity Preservation International (MDPI) 2013
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3926546/
https://ncbi.nlm.nih.gov/pubmed/24451453
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s140100052
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