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Coherence properties of focused X-ray beams at high-brilliance synchrotron sources

An analytical approach describing properties of focused partially coherent X-ray beams is presented. The method is based on the results of statistical optics and gives both the beam size and transverse coherence length at any distance behind an optical element. In particular, here Gaussian Schell-mo...

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Detalhes bibliográficos
Main Authors: Singer, Andrej, Vartanyants, Ivan A.
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2014
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3874016/
https://ncbi.nlm.nih.gov/pubmed/24365911
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577513023850
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