Načítá se...
Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
Ptychography is a scanning coherent diffraction imaging technique which provides high resolution imaging and complete spatial information of the complex electric field probe and sample transmission function. Its ability to accurately determine the illumination probe has led to its use at modern sync...
Uloženo v:
| Vydáno v: | J Synchrotron Radiat |
|---|---|
| Hlavní autoři: | , , , , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
International Union of Crystallography
2020
|
| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7642961/ https://ncbi.nlm.nih.gov/pubmed/33147195 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577520012151 |
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!
|