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A Semi-Automated Positioning System for contact-mode Atomic Force Microscopy (AFM)

Contact mode Atomic Force Microscopy (CM-AFM) is popularly used by the biophysics community to study mechanical properties of cells cultured in petri dishes, or tissue sections fixed on microscope slides. While cells are fairly easy to locate, sampling in spatially heterogeneous tissue specimens is...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: Roy, Rajarshi, Chen, Wenjin, Cong, Lei, Goodell, Lauri A., Foran, David J., Desai, Jaydev P.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: 2013
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC3840952/
https://ncbi.nlm.nih.gov/pubmed/24294144
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/TASE.2012.2226154
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