APA引文

Roy, R., Chen, W., Cong, L., Goodell, L. A., Foran, D. J., & Desai, J. P. (2013). A Semi-Automated Positioning System for contact-mode Atomic Force Microscopy (AFM).

Citação norma Chicago

Roy, Rajarshi, Wenjin Chen, Lei Cong, Lauri A. Goodell, David J. Foran, and Jaydev P. Desai. A Semi-Automated Positioning System for Contact-mode Atomic Force Microscopy (AFM). 2013.

MLA引文

Roy, Rajarshi, et al. A Semi-Automated Positioning System for Contact-mode Atomic Force Microscopy (AFM). 2013.