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Characterization of single 1.8-nm Au nanoparticle attachments on AFM tips for single sub-4-nm object pickup
This paper presents a novel method for the attachment of a 1.8-nm Au nanoparticle (Au-NP) to the tip of an atomic force microscopy (AFM) probe through the application of a current-limited bias voltage. The resulting probe is capable of picking up individual objects at the sub-4-nm scale. We also dis...
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| Main Authors: | , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Springer
2013
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3835868/ https://ncbi.nlm.nih.gov/pubmed/24237663 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-8-482 |
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