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Current–Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope
[Image: see text] Utilizing semiconductor nanowires for (opto)electronics requires exact knowledge of their current–voltage properties. We report accurate on-top imaging and I–V characterization of individual as-grown nanowires, using a subnanometer resolution scanning tunneling microscope with no n...
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| Main Authors: | , , , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
American Chemical Society
2013
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| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3834301/ https://ncbi.nlm.nih.gov/pubmed/24059470 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/nl402570u |
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