Current–Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope

[Image: see text] Utilizing semiconductor nanowires for (opto)electronics requires exact knowledge of their current–voltage properties. We report accurate on-top imaging and I–V characterization of individual as-grown nanowires, using a subnanometer resolution scanning tunneling microscope with no n...

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Hlavní autoři: Timm, Rainer, Persson, Olof, Engberg, David L. J., Fian, Alexander, Webb, James L., Wallentin, Jesper, Jönsson, Andreas, Borgström, Magnus T., Samuelson, Lars, Mikkelsen, Anders
Médium: Artigo
Jazyk:Inglês
Vydáno: American Chemical Society 2013
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC3834301/
https://ncbi.nlm.nih.gov/pubmed/24059470
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/nl402570u
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