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Potentiometric-scanning ion conductance microscopy for measurement at tight junctions
Scanning Ion Conductance Microscopy (SICM) has been developed originally for high-resolution imaging of topographic features. Recently, we have described a hybrid voltage scanning mode of SICM, termed Potentiometric-SICM (P-SICM) for recording transmembrane ionic conductance at specific nanostructur...
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| Autors principals: | , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Landes Bioscience
2013
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3805658/ https://ncbi.nlm.nih.gov/pubmed/24533255 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.4161/tisb.25585 |
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