Implementation of spatial overlap modulation nonlinear optical microscopy using an electro-optic deflector

A spatial overlap modulation (SPOM) technique is a nonlinear optical microscopy technique which enhances the three-dimensional spatial resolution and rejects the out-of-focus background limiting the imaging depth inside a highly scattering sample. Here, we report on the implementation of SPOM in whi...

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Hlavní autoři: Isobe, Keisuke, Kawano, Hiroyuki, Kumagai, Akiko, Miyawaki, Atsushi, Midorikawa, Katsumi
Médium: Artigo
Jazyk:Inglês
Vydáno: Optical Society of America 2013
Témata:
Microscopy
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC3799657/
https://ncbi.nlm.nih.gov/pubmed/24156055
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/BOE.4.001937
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