Chargement en cours...
Multiple regimes of operation in bimodal AFM: understanding the energy of cantilever eigenmodes
One of the key goals in atomic force microscopy (AFM) imaging is to enhance material property contrast with high resolution. Bimodal AFM, where two eigenmodes are simultaneously excited, confers significant advantages over conventional single-frequency tapping mode AFM due to its ability to provide...
Enregistré dans:
| Auteurs principaux: | , , |
|---|---|
| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
Beilstein-Institut
2013
|
| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3701429/ https://ncbi.nlm.nih.gov/pubmed/23844344 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.4.45 |
| Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|