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Multiple regimes of operation in bimodal AFM: understanding the energy of cantilever eigenmodes

One of the key goals in atomic force microscopy (AFM) imaging is to enhance material property contrast with high resolution. Bimodal AFM, where two eigenmodes are simultaneously excited, confers significant advantages over conventional single-frequency tapping mode AFM due to its ability to provide...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: Kiracofe, Daniel, Raman, Arvind, Yablon, Dalia
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Beilstein-Institut 2013
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC3701429/
https://ncbi.nlm.nih.gov/pubmed/23844344
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.4.45
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