Integrated nonlinear optical imaging microscope for on-axis crystal detection and centering at a synchrotron beamline

Nonlinear optical (NLO) instrumentation has been integrated with synchrotron X-ray diffraction (XRD) for combined single-platform analysis, initially targeting applications for automated crystal centering. Second-harmonic-generation microscopy and two-photon-excited ultraviolet fluorescence microsco...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Madden, Jeremy T., Toth, Scott J., Dettmar, Christopher M., Newman, Justin A., Oglesbee, Robert A., Hedderich, Hartmut G., Everly, R. Michael, Becker, Michael, Ronau, Judith A., Buchanan, Susan K., Cherezov, Vadim, Morrow, Marie E., Xu, Shenglan, Ferguson, Dale, Makarov, Oleg, Das, Chittaranjan, Fischetti, Robert, Simpson, Garth J.
Format: Artigo
Sprache:Inglês
Veröffentlicht: International Union of Crystallography 2013
Schlagworte:
Research Papers
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC3682636/
https://ncbi.nlm.nih.gov/pubmed/23765294
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049513007942
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!

Ähnliche Einträge