Integrated nonlinear optical imaging microscope for on-axis crystal detection and centering at a synchrotron beamline

Nonlinear optical (NLO) instrumentation has been integrated with synchrotron X-ray diffraction (XRD) for combined single-platform analysis, initially targeting applications for automated crystal centering. Second-harmonic-generation microscopy and two-photon-excited ultraviolet fluorescence microsco...

पूर्ण विवरण

में बचाया:
ग्रंथसूची विवरण
मुख्य लेखकों: Madden, Jeremy T., Toth, Scott J., Dettmar, Christopher M., Newman, Justin A., Oglesbee, Robert A., Hedderich, Hartmut G., Everly, R. Michael, Becker, Michael, Ronau, Judith A., Buchanan, Susan K., Cherezov, Vadim, Morrow, Marie E., Xu, Shenglan, Ferguson, Dale, Makarov, Oleg, Das, Chittaranjan, Fischetti, Robert, Simpson, Garth J.
स्वरूप: Artigo
भाषा:Inglês
प्रकाशित: International Union of Crystallography 2013
विषय:
Research Papers
ऑनलाइन पहुंच:https://ncbi.nlm.nih.gov/pmc/articles/PMC3682636/
https://ncbi.nlm.nih.gov/pubmed/23765294
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049513007942
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