Integrated nonlinear optical imaging microscope for on-axis crystal detection and centering at a synchrotron beamline

Nonlinear optical (NLO) instrumentation has been integrated with synchrotron X-ray diffraction (XRD) for combined single-platform analysis, initially targeting applications for automated crystal centering. Second-harmonic-generation microscopy and two-photon-excited ultraviolet fluorescence microsco...

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Detalhes bibliográficos
Main Authors: Madden, Jeremy T., Toth, Scott J., Dettmar, Christopher M., Newman, Justin A., Oglesbee, Robert A., Hedderich, Hartmut G., Everly, R. Michael, Becker, Michael, Ronau, Judith A., Buchanan, Susan K., Cherezov, Vadim, Morrow, Marie E., Xu, Shenglan, Ferguson, Dale, Makarov, Oleg, Das, Chittaranjan, Fischetti, Robert, Simpson, Garth J.
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2013
Assuntos:
Research Papers
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3682636/
https://ncbi.nlm.nih.gov/pubmed/23765294
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049513007942
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