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Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating

Infrared temperature sensors, simple device for temperature measurement, have been modified for the measurement of temperature distribution on the metal surface in a way of nondestructive detection of defects of the object. In this study, the IR sensor system is utilized for the defect detection in...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: Kim, Byoung Chul, Heo, Young Gun, Suh, Yong Kweon, Kim, Young Han
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Molecular Diversity Preservation International (MDPI) 2008
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC3675548/
https://ncbi.nlm.nih.gov/pubmed/27879882
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s8053345
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