Kim, B. C., Heo, Y. G., Suh, Y. K., & Kim, Y. H. (2008). Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating. Molecular Diversity Preservation International (MDPI).
Citação norma ChicagoKim, Byoung Chul, Young Gun Heo, Yong Kweon Suh, and Young Han Kim. Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating. Molecular Diversity Preservation International (MDPI), 2008.
MLA引文Kim, Byoung Chul, Young Gun Heo, Yong Kweon Suh, and Young Han Kim. Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating. Molecular Diversity Preservation International (MDPI), 2008.
警告：這些引文格式不一定是100％准確.