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Sequential Path Entanglement for Quantum Metrology

Path entanglement is a key resource for quantum metrology. Using path-entangled states, the standard quantum limit can be beaten, and the Heisenberg limit can be achieved. However, the preparation and detection of such states scales unfavourably with the number of photons. Here we introduce sequenti...

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Detalhes bibliográficos
Main Authors: Jin, Xian-Min, Peng, Cheng-Zhi, Deng, Youjin, Barbieri, Marco, Nunn, Joshua, Walmsley, Ian A.
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group 2013
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Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3646273/
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep01779
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